EQUIPMENT
NTEGRA SPECTRA II – VERSATILE AUTOMATED AFM-Raman, SNOM AND TERS SYSTEM
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High-performance versatile AFM
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Automated AFM laser, probe and photodiode alignment
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Integration with IR s-SNOM
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Investigation of graphene, carbon nanotubes and other carbon materials; semiconductor devices; cellular tissue, DNA, viruses and other biological objects
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Optical device characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices
CNC LaserGRBL Engraving Machine
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Laser power: 100-4500 mW
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Laser wavelength: 450 nm
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Continuous diode laser
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Large scale engraving area
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Bulilt-in firmware: GRBL 1.1f
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Frame Material: Aluminum and Acrylic
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Power Supply: DC12V 5A, Input 100V-240V AC,50/60Hz
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Stepper motor driver: Integrated A4988
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Engraving speed: 100-5000m/min
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Cutting speed: 1-100ms/pixels
AFM NTEGRA NT-MDT system
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Capability performing more than 40 measuring methods:STM, Topography, EFM, KPFM, SCM, PFM, CS-AFM, etc.
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Possibility to carry out experiments in air, as well as in liquids and in controlled environment.
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Investigation of small and big samples with ultra-high resolution (atomic-molecular level) and scanning range up to 100x100x10 µm.
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Appications: Nanomaterials, Nanostructures, Biology and Biotechnology, Materials Science, Magnetic materials, Semiconductors, electric measurements, Polymers and Thin Organic Films, etc.
MST 4000A 4” PROBE STATION
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Leakage Current ~100 fA, accompanied by Option for using Hot Chuck
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Chuck: 4 Inch Low Noise Chuck , On Ceramic Pad, Vacuum Chuck On/off Switch, Chuck Ground, Back Gate
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Magnification: 90x
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Probe Tip: M5BG, HR : 0.5 x 30mm Gold Tungsten or Tungsten; M3BGHR : 0.5 x 30mm Gold Tungsten
POTENTIOSTAT - GALVANOSTAT R-45X
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9 current ranges
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4 potential ranges (± 1V, ± 2V, ± 5V, ± 12V)
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IR - positive feedback compensation
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Pulse modes 2 μs
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Combined cell shutdown method - high-speed CMOS switch and electromagnetic relay
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Current resolution up to 1 pA
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Potential resolution up to 40 μV
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Minimum recommended operating current 200 pA
S150-2 SPECTROMETER
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High spectral resolution (up to 9 pm)
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Measurement of shape and width of the spectral line
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High accuracy of wavelength determination (up to 1 pm)
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Long-term stability. Fixed position of optical elements, small size
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Automatic wavelength calibration. High accuracy and reproducibility of measurement results for the entire instrument lifetime
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Easy-to-use software, possibility to solve non-standard problems